An integrated circuit memory device is designed for high speed data access
and for compatibility with existing memory systems. An address strobe
signal is used to latch a first address. During a burst access cycle the
address is incremented internal to the device with additional address
strobe transitions. A new memory address is only required at the beginning
of each burst access. Read/Write commands are issued once per burst access
eliminating the need to toggle the Read/Write control line at the device
cycle frequency. Transitions of the Read/Write control line during a burst
access will terminate the burst access, reset the burst length counter and
initialize the device for another burst access. The device is compatible
with existing Extended Data Out DRAM device pinouts, Fast Page Mode and
Extended Data Out Single In-Line Memory Module pinouts, and other memory
circuit designs. Additionally, a DRAM is provided having both pipelined
and burst Extended Data Out modes of operation and the ability to switch
between them.