A production managing system for semiconductor devices includes, in a
semiconductor producing center C, production devices 11a-11c for producing
semiconductor devices, in-line measuring devices 12a-12c for measuring
data of a lot, a database 2 storing data of production methods, the
measured data, the specifications of the process steps corresponding to
the measured data, the estimated yield, the data of lot input date and
hour, the data of the scheduled date on which the process step is
performed, the data of actual date of completion in every step and the
data of the scheduled date of completion of the semiconductor devices of
every lot, correspondingly to a lot number data of the semiconductor
devices (chips) and a server 1 including an estimated yield operating unit
1a for calculating the estimated yield, which is a final yield, on the
basis of the specifications and the measured data, and a production
managing unit 1b for performing a production management of semiconductor
devices ordered by a user on the basis of the respective data inputted by
the user and the estimated yield, wherein a user terminal of the user not
only performs a determination whether or not the process processing in
every process is normal but also estimates the final number of normal
products ordered by the user and obtainable finally.
