Defect-free dielectric coatings and preparation thereof using polymeric nitrogenous porogens

   
   

Defect-free dielectric coatings comprised of porous polymeric matrices are prepared using nitrogen-containing polymers as pore-generating agents. The dielectric coatings are useful in a number of contexts, including the manufacture of electronic devices such as integrated circuit devices and integrated circuit packaging devices. The dielectric coatings are prepared by admixing, in a solvent, a polymeric nitrogenous porogen with a high temperature, thermosetting host polymer miscible therewith, coating a substrate surface with the admixture, heating the uncured coating to cure the host polymer and provide a vitrified, two-phase matrix, and then decomposing the porogen. The dielectric coatings so prepared have few if any defects, and depending on the amount and molecular weight of porogen used, can be prepared so as to have an exceptionally low dielectric constant on the order of 2.5 or less, preferably less than about 2.0. Integrated circuit devices and integrated circuit packaging devices manufactured so as to contain the dielectric material of the invention are provided as well.

Os revestimentos dieléctricos defect-free compreendidos de matrizes polymeric porosas são preparados usando polímeros nitrogen-containing como agentes pore-gerando. Os revestimentos dieléctricos são úteis em um número de contextos, including a manufatura de dispositivos eletrônicos tais como dispositivos do circuito integrado e dispositivos empacotando do circuito integrado. Os revestimentos dieléctricos são preparados admixing, em um solvente, por um porogen nitrogenous polymeric com um polímero de alta temperatura, thermosetting do anfitrião miscible therewith, revestindo uma superfície da carcaça com o admixture, aquecendo o revestimento uncured para curar o polímero do anfitrião e para fornecer uma matriz vitrified, bifásica, e então decomposing o porogen. Os revestimentos dieléctricos assim que preparado têm poucos se algum defeito, e dependendo da quantidade e do peso molecular do porogen usados, puder ser preparado para ter uma constante dieléctrica excepcionalmente baixa na ordem de 2.5 ou em menos, preferivelmente mais menos do que aproximadamente 2.0. Dispositivos do circuito integrado e dispositivos empacotando do circuito integrado manufaturados para conter o material dieléctrico da invenção são fornecidos também.

 
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