The present invention relates to a ferroelectric memory device comprising a
cell array block, a data bus unit and a control circuit unit. The cell
array block has a bitline structure including a main bitline and a
plurlaity of sub bitlines. The main bitline is connected to a column
selection controller, and the plurality of sub-bitlines have both
terminals connected to the main bitline, respectively, and connected to a
plurality of unit cells. The data bus unit is connected to the column
selection controller. The control circuit unit includes a sense amplifier
array connected between a data I/O buffer and a sense amplifier data bus
connected to the data bus unit. A plurality of the cell array blocks are
arranged like a matrix. The control circuit unit is disposed in a first
center line of symmetry wherein the first center line is parallel to the
main bitline, and the data bus unit is disposed in a second center line of
symmetry wherein the second center line is vertical to the main bitline.
The layout of the disclosed memory device allows capacitance load of a data
bus to be minimized in a highly integrated circuit, thereby embodying a
high-speed FRAM.