A system, apparatus, and method for analyzing photon emission data to discriminate
between photons emitted by transistors and photons emitted by background sources.
The analysis involves spatial and/or temporal correlation of photon emissions.
After correlation, the analysis may further involve obtaining a likelihood that
the correlated photons were emitted by a transistor. After correlation, the analysis
may also further involve assigning a weight to individual photon emissions as a
function of the correlation. The weight, in some instances, reflecting a likelihood
that the photons were emitted by a transistor. The analysis may further involve
automatically identifying transistors in a photon emission image.
