Memory device capable of performing high speed reading while realizing redundancy replacement

   
   

When normal bit lines BL3 and /BL3 are selected, spare bit lines SBL2 and /SBL2 are simultaneously selected, so that column select gates are placed in such a manner that these bit line pairs are connected to respective different read data bus pairs. The column select gates are distributed in placement so as not to cause a great difference in load capacitance between read data buses. A redundancy determination result is reflected on read data by activation of control signals 1 and 2 given immediately prior to a sense amplifier. Note that two sense amplifier may be provided with control signals 1 and 2 so as to select the outputs of one sense amplifier. With such a configuration adopted, it is possible to provide a memory device capable of performing high speed reading while realizing a redundancy replacement.

 
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