A method and apparatus for determining polarization-resolved scattering parameters
of an optical device. A method comprises stimulating a port of the optical device
with a stimulation field having at least two polarization states, measuring the
optical field emerging from the port in amplitude and phase, and calculating the
scattering parameters using the measurements. By stimulating a port of an optical
device with a stimulation field having at least two different polarization states,
measurements needed to determine scattering parameters of the optical device can
be conducted by stimulating the port with only one sweep of a swept optical source.