A method of manufacturing a light emitting device is provided in which satisfactory
image display can be performed by the investigation and repair of short circuits
in defect portions of light emitting elements. A backward direction electric current
flows in the defect portions if a reverse bias voltage is applied to the light
emitting elements having the defect portions. Emission of light which occurred
from the backward direction electric current flow is measured by using an emission
microscope, specifying the position of the defect portions, and short circuit locations
can be repaired by irradiating a laser to the defect portions, turning them into insulators.
