Method for determining whether two rectangles of an electronic circuit structure overlap

   
   

A method of comparing two rectangles of a circuit design structure for overlap is provided. The two rectangles being compared are modified conceptually in such a way as to reduce the amount of computation necessary to determine if the two rectangles overlap. In one embodiment, a first rectangle is reduced in both x- and y-directions to a single point residing in the center of that rectangle, while the size of the second rectangle is expanded in both x- and y-directions by the same amount, resulting in an enlarged rectangle. A determination of whether the single point resides within the enlarged rectangle thus indicates if the two original rectangles overlap. Similarly, in another embodiment, a first rectangle is reduced in the x-direction only, resulting in a y-directed line segment, while a second rectangle is reduced in the y-direction, resulting in an x-directed line segment. The y-directed line segment is extended by the amount that the second rectangle was reduced in the y-direction, and the x-directed line segment is extended by the amount that the first rectangle was reduced in the x-direction. A determination of whether the x-directed line segment and the y-directed line segment intersect indicates if the first and second rectangles overlap.

 
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