Methods, systems and computer program products for efficiently characterizing
devices under test (DUTs) using a vector network analyzer (VNA) are provided. A
N-port DUT can be divided as appropriate into multiple sub-devices, or multiple
separate devices can be present. A parent calibration is performed. The VNA is
then used to determine the S-parameters of interest for each sub-device or separate
device, preferably without measuring S-parameters that are not of interest. This
can include measuring S-parameters and removing corresponding error coefficients
determined during the parent calibration.
