The present invention discloses a method and system for providing defect management of a bulk data storage media wherein logical addresses of media data blocks are continuously slipped to omit all media data blocks determined to be defective at the time of an initial media format. Thereafter, selectable parameters are utilized to define a logical zone including both a user data area and corresponding replacement data area on the media such that proper selection of the parameters provides defect management optimized for a particular use of the media.

 
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< Integrated circuit with multiple microcode ROMs

< Efficient microcode entry access from sequentially addressed portion via non-sequentially addressed portion

> Address generator for generating addresses for testing a circuit

> Data pend mechanism

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