A method for providing context save and restore using a test scan chain is provided. The method includes dividing a scan chain (34) of digital logic components (24) into a plurality of sub-chains (42). A first data set is provided in the sub-chains (42). The sub-chains (42) are linked in parallel and to a hardware resource for executing an application. The sub-chains (42) are linked to a device memory (18). A first application is executed to update the first data set in the sub-chains (42). The first application is operable to use the hardware resource. The updated first data set is stored in the device memory (18). A second data set is restored from the device memory (18) to the sub-chains (42). A second application is executed to update the second data set in the sub-chains (42). The second application is operable to use the hardware resource.