A semiconductor optical device includes a waveguide layer and a reflecting multi-layer film. The waveguide layer includes two cladding layers and an active layer sandwiched between the two cladding layers. The reflecting multi-layer film including multiple layers is on at least one of a pair of opposing end faces of the waveguide layer. A summation nidi of products nidi of refractive indexes ni and thicknesses di of the layers denoted i in the reflecting multi-layer film, and a wavelength 0 of light guided through the waveguide layer satisfies a relationship, nidi0/4. A first wavelength bandwidth is wider than a second wavelength bandwidth . is a wavelength range including the wavelength 0 in which a reflectance R of the reflecting multi-layer film is not higher than +2.0% from reflectance R at the wavelength 0. is a wavelength range including the wavelength 0 in which a reflectance R of a hypothetical layer is not higher than +2.0% from a hypothetical reflectance R at the wavelength 0 of a hypothetical layer having a thickness of 50/(4nf), a refractive index nf, on the at least one of opposing end faces, and satisfying a relationship, R=((nc-nf2)/(nc+nf2))2, where nc denotes an effective refractive index of the waveguide layer.

 
Web www.patentalert.com

< Solid type single polarization fiber and apparatus

< System and method for fabrication backup planning

> System and method of coinsurance wafer management

> Fiber optic wafer probe

~ 00224