Disclosed is a semiconductor radiation detector element of Schottky barrier
type, comprising: a compound semiconductor crystal including cadmium and tellurium
as main components; and voltage application means for applying voltage to the compound
semiconductor crystal. According to the present invention, said voltage application
means includes a compound of indium, cadmium and tellurium: InxCdyTez
formed on one surface of the compound semiconductor crystal. Preferably, the rate
"z" of occupation of tellurium in the compound InxCdyTez
is in the range of not less than 42.9%, but not greater than 50% by ratio
of number of atoms. Furthermore, preferably, the rate "y" of occupation of cadmium
in the compound InxCdyTez is in the range of not
less than 0%, but not greater than 10% by ratio of number of atoms.