A method and apparatus is presented for measuring jitter tolerance in a device
under test. A device under test is established to operate at a specific frequency.
A bit pattern is generated from a bit pattern generator. The bit pattern generated
by the bit pattern generator is produced at a frequency that is a multiple of the
frequency that the device under test is operating under. Bits are systematically
changed in the bit pattern and then errors are measured in the device under test.
As a result, the jitter tolerance of the device under test is measured.