A system and method for implementation of look-ahead design methodology. Efficient debugging of a design is accomplished by evaluating the high level register transfer level (RTL) representation of a device being designed by quickly simulating the downstream implementation of that device to expose potential implementation problems that would otherwise be found much later in the design or manufacturing cycle.

 
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< Deterministic bist architecture including MISR filter

< Semiconductor memory device with built-in self test circuit operating at high rate

> Leakage power optimization for integrated circuits

> Estimating current density parameters on signal leads of an integrated circuit

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