To provide a nonvolatile memory microcomputer with which a step of testing a
microcomputer
unit using a logic tester can be omitted, thereby reducing the testing cost. A
memory tester supplies test data and expectation data to the nonvolatile memory
microcomputer, and the nonvolatile memory microcomputer stores them in a nonvolatile
memory. Subsequently, upon receiving an address signal, the nonvolatile memory
outputs a test signal and an expectation signal based on test data and expectation
data corresponding to the address signal. The test signal is supplied to a circuit
block in the microcomputer unit, to drive the circuit block. The circuit block
returns a test result signal, which is output to the memory tester together with
the expectation signal. The memory tester compares the test result signal and the
expectation signal, to judge whether the microcomputer unit operates correctly.