A method and system are disclosed for running a manufacturing-level test program on an installed processor by interrupting processor execution of a non-test process. Periodic execution of the manufacturing-level test program allows the processor to continually self-test during normal function operation, in order to facilitate proper maintenance and function of the processor and a data processing system of which the processor is a part.

 
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> Method of and apparatus for correcting errors in data packet flow streams as in closed ring sequential address generators and the like without data flow stream interruption

> Method and apparatus for enhancing the performance of event driven dynamic simulation of digital circuits based on netlist partitioning techniques
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