A method for detection of fluorescent light in scanning microscopy includes dividing an illuminating light beam into a plurality of partial illuminating beams so as to illuminate multiple specimen regions simultaneously. Fluorescing materials in a specimen region are excited via multi-photon excitation. Operating parameters of the light source are adapted for optimum fluorescent photon yield to the properties of the fluorescing material in the specimen region. Fluorescent light of the specimen regions is detected simultaneously.