A test system for an integrated circuit includes a grouping module grouping measurement points on basis of values of the quiescent supply current and setting measurement point groups; an average value setting module setting a weighted average value minimizes the sum of dispersion of the quiescent supply current; a calculating module calculating a maximum estimated value of dispersion of the quiescent supply current on the basis of the weighted average value; and a judgment module judging whether the integrated circuit passes or fails the judgment specification.