An antireflective member according to the present invention has an uneven surface pattern, in which unit structures are arranged in x and y directions at respective periods that are both shorter than the shortest wavelength of an incoming light ray, on the surface of a substrate and satisfies the following Inequality (1): .LAMBDA. .times. .times. x , y .lamda. min < 1 ni + ni sin .times. .times. .theta. .times. .times. i max ( 1 ) where .lamda..sub.min is the shortest wavelength of the incoming light ray, .theta.i.sub.max is the largest angle of incidence of the incoming light ray, ni is the refractive index of an incidence medium, .LAMBDA.x is the period of the uneven surface pattern in the x direction, and .LAMBDA.y is the period of the pattern in the y direction. As a result, diffraction of short-wave light components can be reduced in a broad wavelength range.