A system for isolating effects of one or more process parameters on performance of a heat transfer device is provided. The system includes an efficiency correction unit that is adapted to receive data from the heat transfer device. The data is representative of one or more measurable process parameters or a change in the one or more measurable process parameters of the heat transfer device. The efficiency correction unit is also configured to compute a normalized efficiency of the heat transfer device. The normalized efficiency represents a corrected efficiency that isolates effects of one or more process parameters on performance of the heat transfer device.