In one embodiment, a scheduler for use with a star switching fabric includes a scheduling star switching fabric operable to receive a plurality of packets each associated with one of a plurality of wavelengths and a plurality of selecting elements associated with the scheduling star switching fabric. Each of the plurality of selecting elements is operable to contribute to selectively passing packets from the scheduling star switching fabric for receipt by a transmission star switching fabric. Packets received at the transmission star switching fabric over a given time period comprise a more uniform load distribution than packets received at an input to the scheduler over the same period of time.

 
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> Method and apparatus for testing a device in an electronic component

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