A touch-down counter is provided that maintains a count of how many times integrated circuits are placed into contact with a contactor in a test handler. The test handler has a work press that places integrated circuits into contact with pogo pins in the contactor. The pins are subject to wear and should be maintained by periodic cleaning. The touch-down counter has a sensor such as a non-contact Hall effect sensor that is attached to the contactor. A magnet is affixed to the side of the work press. When the work press comes into the vicinity of the sensor, the sensor detects the presence of the magnet and registers a contactor touch-down event. A lifetime count of touch-down events may be displayed on the counter. When a recommended threshold value of touch-down events has been exceeded, a test system operator can remove the contactor from use for cleaning.