The present invention is directed to a system and method for quality
improvement by identifying test patterns for DFT logic faults and
functional logic faults. The identified test patterns may be selectively
utilized for pruning of patterns or DPM estimation. Functional faults and
DFT faults may be identified from detected TDF faults. The functional
faults are faults on a logic which was present in a pre-test insertion
net list. Remaining faults are the DFT faults. A set of test patterns for
DFT faults may be utilized as the first target for the pattern truncation
which will reduce the amount of test patterns to be tested. A set of test
patterns for functional may be utilized for improving the TDF coverage.