Described are techniques used in a wire diagnostics system to detect
events, such as defects, that may occur within a wire or cable under
test. An incident voltage signal is sent out on the wire and a measured
voltage signal is obtained which includes the incident voltage and the
reflected voltage. Compensation processing is performed on the measured
waveform to remove unwanted reflective components. Additionally, the
waveform is then subject to attenuation processing and event detection
processing. Detected events, such as defects, are classified and output
as results. Events are classified by parametric classification using a
library of known events or faults. The library of known events or faults
is previously generated using empirical analysis and modeling techniques.
Additionally, joint time-frequency domain reflectometry (TFDR) techniques
are described for event identification and classification for a wire
under test.