This invention relates to a compact cavity ring down spectrometer for detection and measurement of trace species in a sample gas using a tunable solid-state continuous-wave mid-infrared PPLN OPO laser or a tunable low-power solid-state continuous wave near-infrared diode laser with an algorithm for reducing the periodic noise in the voltage decay signal which subjects the data to cluster analysis or by averaging of the interquartile range of the data.

 
Web www.patentalert.com

< Process for production of alkyltin alkoxides

> Silicon-containing layer deposition with silicon compounds

> Thin film forming apparatus

~ 00524