A semiconductor device includes a silicon nitride (SiN) film provided on a crystal surface of a nitride semiconductor, the SiN film having a hydrogen content equal to or smaller than 15 percent.
Web www.patentalert.com
< Method of manufacturing a semiconductor device having a pre-metal dielectric liner
> Liquid crystal display device and fabricating method thereof
> Wide bandgap HEMTs with source connected field plates
HOME | NEW USER | LOGIN | SUBSCRIPTIONS | SEARCH | GUESTBOOK | CONTACT