Various embodiments of the present invention relate to a device for testing an integrated circuit. According to one embodiment, the device comprises a first connector coupled to receive a device under test and a second connector coupled to receive compressed test data by way of test equipment. The device also comprises a decompressor coupled to receive compressed test data, and provided decompressed test data to the device under test. Embodiments implementing two different clocks to improve the speed of testing integrated circuits are also disclosed. Various methods for coupling test signals to a device under test are also disclosed.