This disclosure concerns a semiconductor memory device comprising memory cells; word lines connected to the gates of the memory cells; bit lines connected to the drains of the plurality of memory cells; sense amplifiers detecting data stored in the memory cells via the bit lines, the sense amplifiers writing data to the memory cells via the bit lines and latching read data or data to be written; and a plurality of transfer gates connecting or disconnecting the sense amplifiers to or from the bit lines, in a period of a serial access for continuously writing the data to the memory cells connected to an activated word line among the word lines, the transfer gates connecting the sense amplifiers to the bit lines corresponding to the sense amplifiers, respectively, after the sense amplifiers corresponding to the memory cells latch the data.