An apparatus for detecting an electronic device testing socket including a testing base, a detecting circuit board, a depth gauge, and a conductive pressing block is provided. The detecting circuit board disposed on the testing base has a carrying surface for carrying an electronic device testing socket. The electronic device testing socket includes a plurality of pin units, and each of the pin units includes an S-shaped pin and a pair of elastic rods accommodated within recesses thereof. The depth gauge disposed on the testing base presses against a top surface of the conductive pressing block, and presses with a bottom surface thereof against the electronic device testing socket. The depth gauge is adapted to adjust a distance between the top surface of the conductive pressing block and the carrying surface. The detecting circuit board is electrically connected to the pin units for detecting the status of the pin units.