The present invention features a method to determine relative spatial parameters between two coordinate systems, which may be a mold and a region of a substrate in which mold is employed to generate a pattern. The method includes sensing relative alignment between the two coordinate systems at multiple points and determines relative spatial parameters therebetween. The relative spatial parameters include a relative area and a relative shape.

 
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< Liquid crystal display and manufacturing method therefor comprising alignment films of oriented carbon nanotubes

> Nano-electronic memory array

> Laser system for generation of high-power sub-nanosecond pulses with controllable wavelength in 2-15 .mu.m region

~ 00564