Sample analysis apparatuses are disclosed that can include processing circuitry configured to acquire one data set from an analysis component configured according to one analysis parameter set, and prepare another analysis parameter set using another previously acquired data set. Sample analysis methods are also disclosed that can include acquiring first and second data sets from an analysis component and using the process and control component to process the first data set to prepare a second analysis component parameter set. Sample analysis instruments are disclosed that can include processing circuitry coupled to a storage device with the storage device including analysis component parameter sets associated with data parameter values with individual ones of the analysis component parameter sets being associated with individual ones of the data parameter values.