A probe card includes a base wiring layer, a rewiring layer, and a
contactor. The base wiring layer has a non-contactor area and a contactor
area that projects to a higher level than the non-contactor area. The
rewiring layer is formed on a surface of the base wiring layer so that
the contactor area is higher than the non-contactor area. The contactor
is provided on a surface of the rewiring layer in a contactor area
thereof.