A high volume testing/formatting process is provided for Universal Serial
Bus-based (USB-based) electronic data flash cards (USB devices) that
meets the increasing demand for USB electronic data flash cards (USB
devices). A test host is simultaneously coupled to the multiple USB
devices (e.g., using a multi-port card reader or a probe fixture), a
controller endpoint value is read from each of the USB devices and
verified with a known good value, and then testing/formatting is
performed on each of the USB devices by writing predetermined data into
each USB device in a pipelined manner, then reading out and testing the
predetermined data. In one embodiment, the test host implements a special
a USB driver that blocks standard USB registration procedures upon
detecting the plurality of USB devices. Control and/or boot code data are
written onto the flash memory device (i.e., instead of being provided on
a controller ROM).