Integrated circuit with a reduced risk of punch-through between buried layers, and fabrication process

   
   

The semiconductor substrate of the integrated circuit includes at least one dielectrically isolating, vertical buried trench (2) having a height at least five times greater than its width, the trench laterally separating two regions (4, 5), and an epitaxial semiconductor layer (6) coveting the trench. An application is advantageously suited to MOS, CMOS and BiCMOS technologies.

Le substrat de semi-conducteur du circuit intégré inclut au moins on isolant diélectriquement, le fossé enterré vertical (2) ayant une taille au moins cinq fois plus grandes que sa largeur, le fossé séparant latéralement deux régions (4, 5), et une couche épitaxiale de semi-conducteur (6) convoitant le fossé. Une application est avantageusement convenue au MOS, au CMOS et aux technologies de BiCMOS.

 
Web www.patentalert.com

< SOI based bipolar transistor having a majority carrier accumulation layer as subcollector

< MOSFET with graded gate oxide layer

> Integrated circuit having oversized components

> Wafer pattern variation of integrated circuit fabrication

~ 00141