The electrically programmable three-dimensional memory (EP-3DM) can be used
to carry the test data and/or test-data seeds for the circuit-under-test
(CUT). When integrated with the CUT, EP-3DM has minimum impact to the
layout of the CUT. Apparently, CUT with integrated EP-3DM supports IC
self-test. Moreover, with a large bandwidth with the CUT, EP-3DM-based IC
self-test enables at-speed test.
