A semiconductor device includes an insulating layer, a conducting portion, and
a modified layer. The insulating layer is formed on a semiconductor substrate.
The conducting portion is formed in the insulating layer. The modified layer is
formed between the insulating layer and the conducting portion. The insulating
layer includes hydrogenated polysiloxane. The modified layer is a layer to which
the hydrogenated polysiloxane is modified. A portion of the modified layer far
from the semiconductor substrate may be thicker than a portion of the modified
layer near the semiconductor substrate.