A test system for digital camera modules used in consumer electronics, e.g. cellular phones and PDA's is shown. The test system comprises of a tester and a module handler that is aimed at reducing test time by an order of magnitude. The Test system has an image-processing unit that uses N-parallel processor to reduce the computation time on a test image by approximately the number of parallel processors. The handler is controlled by the tester to select, focus and test small digital camera modules. There are two test stations in the handler, where a first test station performs tests on a first camera module while a second test station is loaded with a second camera module, thus burying the loading time within the test time.