Method and apparatus for determining wafer quality profiles

   
   

A method includes processing a workpiece in a process flow. Workpiece state trace data is collected for the workpiece during its processing in the process flow. A quality profile of the workpiece is generated based on the workpiece state trace data. A manufacturing system includes a plurality of tools configured to process a workpiece in a process flow and a quality monitor. The quality monitor is configured to collect workpiece slate trace data for the workpiece during its processing in the process flow generate a quality profile of the workpiece based on the workpiece state trace data.

Um método inclui processar um workpiece em um fluxo process. Os dados do traço do estado do workpiece são coletados para o workpiece durante seu processar no fluxo process. Um perfil da qualidade do workpiece é gerado baseou nos dados do traço do estado do workpiece. Um sistema de manufacturing inclui um plurality das ferramentas configuraradas para processar um workpiece em um fluxo process e em um monitor da qualidade. O monitor da qualidade é configurarado para coletar dados do traço do slate do workpiece para o workpiece durante seu processar no fluxo process gera um perfil da qualidade do workpiece baseado nos dados do traço do estado do workpiece.

 
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