A method and system for automatically instantiating built-in-system test (BIST) modules in memory designs is disclosed. The method and system include providing a server over a network that integrates a set of design tools, including an automated front-end software process and an automated back-end software process. According to the method and system, a user may access the server over the network and enter a request for a memory design. The front-end software process is then executed to automatically generate a netlist of a BIST from the user request. Thereafter, the back-end software process is executed to automatically generate a placement and route view of the BIST.

 
Web www.patentalert.com

< Design and optimization methods for integrated circuits

< Semiconductor device and method for fabricating the same

> Maximum flow analysis for electronic circuit design

> Method and apparatus for determining viability of path expansions

~ 00201